30 MAY 2011
16:30-18:30
Room Lehar
Development of measurement methods at the nanoscale is a fundamental task. A major issue is accurate control of the dimensions of objects, with size determined by Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM) or various scattering methods. Size is also an important parameter when identifying safety and risk issues.
Chair
RIVAS, Jose
Director General
International Iberian Nanotechnology Laboratory
Keynote:
KOENDERS, Ludger
Physikalisch-Technische Bundesanstalt (DE)
Defining a Strategy for Nanometrology in Europe – Aspects of Dimensional and Mechanical Nanotechnology – download
Speakers:
JARVIS, Duncan
European Metrology Research Programme (EMRP)
The European Metrology Research Programme – Collaboration between National Measurement Institutes to Accelerate Innovation and Competitiveness in Europe – download
LAEMMLE, Wolfgang
SYMPATEC GmbH (DE)
Particle-Size-Measuring in the Nanometer-Range – download
BOLZE, Joerg
PANalytical B.V., Application Competence Center (NL)
Nanomaterials Analysis by Small-Angle X-Ray Scattering on a Multi-Purpose X-Ray Diffractometer – available on request
BETZ, Wolfgang
PHI – Physical Electronics. (DE)
Applications of 2- and 3-dimensional Analysis on Nanostructured Materials – download
ROSTA, Laszlo
Budapest Neutron Centre, Neutron Spectroscopy Department (HU)
Neutron Scattering – to Reveal Nano-Scale Structures in Functional Materials – download
